| Scanning Microscopy |
ISSN: 0891-7035 |
Scanning Microscopy International, P.O. Box 66507
AMF O'Hare (Chicago), IL 60666, USA
Telephone: (847) 524-6677 / FAX: (847) 985-6698 / E.mail:73211.647@compuserve.com
Page 1
Guest Editorial
M. Zinke Allmang, E.D. Williams, H. Iwasaki
Page 3
Nucleation, Growth and Coarsening in Phase-Separating Systems
C. Sagui, D. Stinson O’Gorman, M. Grant
Page 9
Transition of Growth Mode in Electrochemical Deposition of Copper: Atomic Force Microscopy Analysis and Simulation
A. Iwamoto, K. Sudoh, T. Yoshinobu, H. Iwasaki
Page 17
The Dynamics of Steps on Vicinal Surfaces During Reconstruction-Driven Faceting
H.-C. Jeong, J.D. Weeks
Page 31
The Evolution of Rotating Silicon Surfaces During Ion Bombardment
G.R. Carlow
Page 43
Scanning Probe Microscopy of Semiconductor Heterostructures
C.K. Shih, S. Gwo, A.R. Smith, K.-J. Chao, G. Guttroff, J.W. Keto
Page 61
Application of Scanning Tunneling/Atomic Force Microscope Nano-Oxidation Process to Room Temperature Operated Single Electron Transistor and Other Devices
K. Matsumoto
Page 71
Scanning Probe Microscopy Studies of Electrically Active Defects in Lattice Mismatched Films
J.W.P. Hsu, M.H. Gray, Q. Xu
Page 81
Simulations of Homoepitaxial Growth of Pt(111): Island Shapes and the Growth Mode
J. Jacobsen, K.W. Jacobsen and J.K. Nørskov
Page 93
Fresnel Projection Microscopy, Theory and Experiment: Electron Microscopy with Nanometer Resolution at 200 Volts
Vu Thien Binh, V. Semet, S.T. Purcell, F. Feschet
Page 107
Relaxation of Surface Corrugations Below the Roughening Temperature
M.V.R. Murty, B.H. Cooper
Page 113
Correlation Between Scanning Tunneling Microscopy (STM)-Induced Photon Map and the STM Topography of Nanometer-Size Metal Particles
R. Nishitani, T. Umeno, A. Kasuya, Y. Nishina
Page 119
Cobalt Grain Growth on Clean Si(100) Surfaces
T.D. Lowes, M. Zinke–Allmang
Page 131
Backscattering of Positrons from Solid Targets
M. Dapor, A. Miotello
Page 139
A Scanning Force Microscope Combined With a Scanning Electron Microscope for Multidimensional Data Analysis
M. Troyon, H.N. Lei, Z. Wang, G. Shang
Page 149
Dislocation Luminescence in Cadmium Telluride
H.S. Leipner, J. Schreiber, H. Uniewski, S. Hildebrandt
Page 161 Backscattered
Electrons Topographic Mode Problems in the Scanning Electron Microscope
D. Kaczmarek
Page 185
Backscattering Coefficients for Low Energy Electrons
A.M.D. Assa’d, M.M. El Gomati
Page 193
Quadratic Response Theory for the Interaction of Charged Particles with an Electron Gas
J.M. Pitarke, I. Campillo
Page 205
Models for Interpreting Scanning Capacitance Microscope Measurements
J.F. Marchiando, J.R. Lowney, J.J. Kopanski
Page 225
Three-Dimensional Probe and Surface Reconstruction for Atomic Force Microscopy Using a Deconvolution Algorithm
A.A. Bukharaev, N.V. Berdunov, D.V. Ovchinnikov, K.M. Salikhov
Page 235
Scanning Tunneling Microscopy Studies of Phase Transitions in Liquid Crystals
M. Rivera Hernandez, M.J. Miles
Page 243
Changes in Surface Stress Measured with an Atomic Force Microscope
R. Raiteri, H.-J. Butt, M. Grattarola
Page 253 List of Reviewers for Scanning Microscopy Vol. 12, Number 1, 1998