Scanning Microscopy

ISSN: 0891-7035

Volume 12, 1998, Pages 1-254

Scanning Microscopy International, P.O. Box 66507
AMF O'Hare (Chicago), IL 60666, USA
Telephone: (847) 524-6677 / FAX: (847) 985-6698 /

Table of Contents

Table of Contents

Page 1 Guest Editorial
M. Zinke Allmang, E.D. Williams, H. Iwasaki

Page 3 Nucleation, Growth and Coarsening in Phase-Separating Systems
C. Sagui, D. Stinson O’Gorman, M. Grant

Page 9 Transition of Growth Mode in Electrochemical Deposition of Copper: Atomic Force Microscopy Analysis and Simulation
A. Iwamoto, K. Sudoh, T. Yoshinobu, H. Iwasaki

Page 17 The Dynamics of Steps on Vicinal Surfaces During Reconstruction-Driven Faceting
H.-C. Jeong, J.D. Weeks

Page 31 The Evolution of Rotating Silicon Surfaces During Ion Bombardment
G.R. Carlow

Page 43 Scanning Probe Microscopy of Semiconductor Heterostructures
C.K. Shih, S. Gwo, A.R. Smith, K.-J. Chao, G. Guttroff, J.W. Keto

Page 61 Application of Scanning Tunneling/Atomic Force Microscope Nano-Oxidation Process to Room Temperature Operated Single Electron Transistor and Other Devices
K. Matsumoto

Page 71 Scanning Probe Microscopy Studies of Electrically Active Defects in Lattice Mismatched Films
J.W.P. Hsu, M.H. Gray, Q. Xu

Page 81 Simulations of Homoepitaxial Growth of Pt(111): Island Shapes and the Growth Mode
J. Jacobsen, K.W. Jacobsen and J.K. Nørskov

Page 93 Fresnel Projection Microscopy, Theory and Experiment: Electron Microscopy with Nanometer Resolution at 200 Volts
Vu Thien Binh, V. Semet, S.T. Purcell, F. Feschet

Page 107 Relaxation of Surface Corrugations Below the Roughening Temperature
M.V.R. Murty, B.H. Cooper

Page 113 Correlation Between Scanning Tunneling Microscopy (STM)-Induced Photon Map and the STM Topography of Nanometer-Size Metal Particles
R. Nishitani, T. Umeno, A. Kasuya, Y. Nishina

Page 119 Cobalt Grain Growth on Clean Si(100) Surfaces
T.D. Lowes, M. Zinke–Allmang

Page 131 Backscattering of Positrons from Solid Targets
M. Dapor, A. Miotello

Page 139 A Scanning Force Microscope Combined With a Scanning Electron Microscope for Multidimensional Data Analysis
M. Troyon, H.N. Lei, Z. Wang, G. Shang

Page 149 Dislocation Luminescence in Cadmium Telluride
H.S. Leipner, J. Schreiber, H. Uniewski, S. Hildebrandt

Page 161 Backscattered Electrons Topographic Mode Problems in the Scanning Electron Microscope
D. Kaczmarek

Page 185 Backscattering Coefficients for Low Energy Electrons
A.M.D. Assa’d, M.M. El Gomati

Page 193 Quadratic Response Theory for the Interaction of Charged Particles with an Electron Gas
J.M. Pitarke, I. Campillo

Page 205 Models for Interpreting Scanning Capacitance Microscope Measurements
J.F. Marchiando, J.R. Lowney, J.J. Kopanski

Page 225 Three-Dimensional Probe and Surface Reconstruction for Atomic Force Microscopy Using a Deconvolution Algorithm
A.A. Bukharaev, N.V. Berdunov, D.V. Ovchinnikov, K.M. Salikhov

Page 235 Scanning Tunneling Microscopy Studies of Phase Transitions in Liquid Crystals
M. Rivera Hernandez, M.J. Miles

Page 243 Changes in Surface Stress Measured with an Atomic Force Microscope
R. Raiteri, H.-J. Butt, M. Grattarola

Page 253 List of Reviewers for Scanning Microscopy Vol. 12, Number 1, 1998